Check Ukraine import data of 100 fo under HS code 8506101100. Get import data of Ukraine for HS code 8506101100
Date | HS Code | Product Description | Origin Country | Quantity | Net Weight [KGS] | Total Value [USD] | Importer Name |
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24/Apr/2017 | 8506101100 | "1.Raster electron microscope JSM-ІT300LV (in a disassembled state) -1 pieces (Microscope JSM-ІT300LV is a raster electronic microscope with the ability to work in a low-volume environment. Raster optical is the formation of images from individual elements by combining different transparent and non transparent lacquer ( Raster), converting directed beams of rays.Raster electron microscope consists of the following main nodes: -electron gun, emitting electrons; -console with a column and a vacuum system-an electron-optic system forming an electronics Throne bundle and providing scanning on the surface of the image (personal computer, liquid crystal display), an external control interface, internal control software, a control module, an image module, a sample chamber, a side camera for examining a sample camera, - a gateway control system, a gateway Cameras; -vacuum chamber; -detector of secondary electrons for low-vacuum mode and a current-beam detector; -energidessersion spectrometers; VDS spectrometer (turret up to 6 crystals); -crystals, diaphragms, seals, rubber caps to goggles, adapters, and other kabelizhyvlennya flexible svitlovid set standards, an additional lens cathodes; -stil operator. The microscope is equipped with a convenient and easy to use interface. It has a high performance due to high-speed switching and control capabilities via the touch screen as an addition to high-quality electron optics with an advanced vacuum vacuuming system and system capture and image construction.CHARACTERISTICS: Type of source of electrons // cathode of direct tungsten tungsten; Low-volume mode // from 10 to 650 Pa. Spatial differentiation // 3 nm at 30kV, 15nm at 1kV; Spatial differentiation in low-vacuum in the mode // 4nm; The energy of electron beam // from 300 eV to 30 keV; Increase // from 5 to 300000 times on a print format of 10x15cm; I am going through the jet // from 1pA to 1μA; Maximum sample size // 20mm in diameter and 80mm in thickness; Sample table // eucentric, motorized torsional (five) cordate, with a range travel of X-125mm, Y-100mm, Z-80mm, inclination of 10 to 90graduses, rotation-360 degrees without stop; Suction Vacuum Vacuum Turbomolecular Pump, For Vacuum Pumps; Sysculate // option. The microscope is based on the use of a pre-formed fine electronic ray (probe), whose position is controlled by electromagnetic fields. Under the influence of beam electrons there is a series of processes characteristic of this material and its structure.These include scattered primitive electrons, emission (emission) of secondary electrons, the appearance ofelectrons, passed through the object (in the case of thin objects), the extinction of the characteristic radiation. APPOINTMENT OF A MICROSCOPE: - obtaining an image of a surface with a nanometer resolution; - local determination of the contents of a wide range of chemical compounds and materials (ceramics, alloys, polymers). Software: Microscope management is carried out " | CHINA | 74416 | 1580.23 | 8037.960137 | View Importer |
Our market research report and Ukraine export statistics of 100 fo covers market share of Ukrainian companies and market price of sunglass. This helps you to do market analysis on the basis of price, company, etc. perfectly and study market size of sunglass in Ukraine. Few shipment records with a small number of important columns from Ukraine export data of sunglass are given above. Other hidden fields such as Ukrainian Exporter Name with Address, Foreign er Name with Address, Value, Quantity, Origin & Destination Country and more are also covered in Ukraine customs data of sunglass. To view more shipment records of sunglass export data of Ukraine, you can set a filter by Country Name or HS Code on the left side.
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